The Laboratory of Image Processing and Recognition:

Scientific visits abroad, and overseas visitors to LIPR

SCIENTIFIC VISITS ABROAD, AND OVERSEAS VISITORS TO LIPR

Scientific visits of LIPR staff to other countries:
1995
1. S.Ablameyko
  - Institute of Cybernetics of CNR, Napoli, Italy ;
  - SPIE/IEEE Symposium on Visual Communication and Image Processing'95, Taipei, Taiwan;
  - International conference "Computer Analysis of Images and Patterns", Prague, Czech Republic;
2. V.Starovoitov
  - University of Jena, Germany;
  - International Conference "Computer Analysis of Images and Patterns", Prague, Czech Republic;
  - Summer School on Morphological Image and Signal Processing, Zakopane, Poland;
3. D.Lagunovsky
  - Uppsala University of Agricultural Sciences, Uppsala, Sweden;
4. O.Frantskevich
  - MATRA CAP SYSTEMS, Toulosse, France;
5. O.Okun
  - Uppsala University of Agricultural Sciences, Uppsala, Sweden;
  - 9th Scandinavian Conference on Image Analysis, Uppsala, Sweden.
6. S.Demidenko
  - Singapore Polytechnic, Singapore;
  - 6th International Symposium on "IC Technology, Systems and Applications, Singapore;
  - 4th Asian Test Symposium, Bangalore, India;
  - Seminar "Future Trends in Automatic Testing", Singapore;
  - IEEE Singapore International Conference on Signal Processing, Circuits and Systems, Singapore.
1996
1. S.Ablameyko
  - University of Murcia, Spain;
  - University of Kiel, Germany;
  - University of Coventry, UK;
2. V.Starovoitov
  - Strathclyte University, Glasgow, Scotland;
  - University of Surrey, Guilford, England;
  - University of Napoli, Italy;
  - University of Palermo, Palermo, Italy;
  - Institute of Cybernetics of CNR, Napoli, Italy;
3. V.Tuzlukov
  - University of Florida, Orlando, Florida, USA;
  - SPIE International Symposium on AeroSense: Aerospace/Defense Sensing, Simulation and Control, Orlando, Florida, USA;
4. V.Bereishik
  - Geometry House, Budapest, Hungary;
5. O.Frantskevich
  - Geometry House, Budapest, Hungary;
6. O.Okun
  - 4th International Conference "Computer Graphics and Image Processing", Poland.
  - S.Demidenko
  - Singapore Polytechnic, Singapore;
  - IEEE International Workshop on "Memory Technology, Design and Test", Singapore;
  - Fifth Asian Test Symposium, Hsinchu, Taiwan;
  - Hsinchu Science Based Industrial Park, Taiwan.
1997
1. S.Ablameyko
  - University of Coventry, UK;
  - MATRA, Paris, France;
  - Belarusian Scientific and Technical Exhibition "BIMTEX'97", Hyderabad, India;
2. V.Bereishik
  - MATRA, Paris, France;
3. D.Lagunovsky
  - 7th International Conference Computer Analysis of Images and Patterns", Kiel, Germany;
4. O.Okun
  - 10th Scandinavian Conference on Image Analysis, Lappeenranta, Finland;
5. V.Tuzlukov
  - San Diego State University, San Diego, California, USA;
  - Nanyang Technological University, Singapore;
  - SPIE International Symposium on AeroSense: Aerospace/Defense Sensing, Simulation and Control, Orlando, Florida, USA;
  - SPIE International Symposium on Optical Science, Engineering and Instrumentation, San Diego, California, USA;
  - International Geoscience and Remote Sensing Symposium (IGARSS'97), Singapore;
6. V.Starovoitov
  - University of Rome, Rome, Italy.
  - Bosphorus University, Istanbul, Turkey
7. S.Demidenko
  - Singapore Polytechnic, Singapore;
  - 7th International Symposium "IC Technology, Systems and Applications", Singapore;
  - 3rd IEEE International Mixed-Signal Testing Workshop, Seattle, USA;
  - The University of Washington, USA.
Overseas visitors to LIPR:
1995
- Dr. E.Bajalinov, Kossuth Lajos University, Debrecen (Hungary);
- Dr. A.Dragalin, Kossuth Lajos University, Debrecen (Hungary);
- Dr.T.Lehmann, Technical University of Aachen (Germany);
- Dr.A.Tujaka, Technical University of Szczecin (Poland).
1996
- J.Lorriman, Institution of Electrical Engineers (UK);
- Prof. P.Foyer, Coventry University (UK);
- Prof. L.Barros, University of Troyes (France);
- Dr. A.Dolgui, University of Troyes (France).
1997
- Dr. A.Gagalowicz, INRIA (France);
- Prof. V.Di Gesu, University of Palermo (Italy);
- Dr. S.Kebairi, University le Havre (France);
- Prof. M.Rodd, University of Wales Swansea (UK);
- Prof. L.Motus, University of Tallinn, (Estonia);
- Dr. G.Holowinski, Technical University of Szczecin (Poland).
- B.Zitova, Institute of Information Theory and Automation (Czech Republic)
- R.Krejci, Institute of Information Theory and Automation (Czech Republic)

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